Lateral Force Mode

The Dimension Icon SPM is capable of measuring frictional forces on the surfaces of samples using a special measurement known as lateral force microscopy (LFM). The name derives from the fact that cantilevers scanning laterally (perpendicular to their lengths) are torqued more as they transit high-friction sites; low-friction sites tend to torque cantilevers less. The relative measure of lateral forces encountered along a surface yields a map of high- and low-friction sites.

After obtaining a good topographical image in Contact AFM Mode, it is relatively easy to use LFM to view and acquire lateral force data. It is important to obtain a good image in Contact mode before measuring LFM data. The NanoScope system will continue to run the feedback based on measuring the vertical deflection signal and feedback gains in the Feedback panel while LFM data is acquired and displayed.

Further information:

• How LFM Works
• Basic LFM Operation
• Advanced LFM Operation

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